Advantages of Low-kV TEM in the Study of Beam Sensitive Materials.
| Autor: | Yaguchi, Toshie, Kilcrease, Jim, Igarashi, Keisuke, Wakui, Akiko, Tamura, Keiji |
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| Zdroj: | Microscopy & Microanalysis; 2020Supplement2, Vol. 26 Issue S2, p554-555, 2p |
| Databáze: | Complementary Index |
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