Transmission Electron Miscroscopy Study of the Fused Silicon/Diamond Interface.

Autor: Yushin, G. N., Wolter, S. D., Kvit, A. V., Collazo, R., Prater, J. T., Sitar, Z.
Zdroj: MRS Online Proceedings Library; 2003, Vol. 768 Issue 1, p1-6, 6p
Databáze: Complementary Index
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