Polarization induced 2DEG in MBE grown AlGaN/GaN HFETs: On the origin, DC and RF characterization.

Autor: Vetury, R., Smorchkova, I. P., Elsass, C. R., Heying, B., Keller, S., Mishra, U. K.
Zdroj: MRS Online Proceedings Library; 2000, Vol. 622 Issue 1, p1-6, 6p
Databáze: Complementary Index