| Autor: |
I. A., Arkhandeev, I. I., Ogorodnikov, L. V., Yashina, T. V., Kuznetsova, M. V., Kuznetsov, Knyazev, Boris, Vinokurov, Nikolay |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2020, Vol. 2299 Issue 1, p1-6, 6p |
| Abstrakt: |
In this paper, the current state of X-ray photoelectron diffraction and holography methods are considered. A brief overview of surface research methods is given. The photoelectron diffraction method is attractive for use because of its sensitivity to the chemical environment, as well as its large depth of analysis (units of nanometers). The paper presents the application of methods for studying the atomic structure of bismuth chalcogenides Bi2X3 (X: Se,Te). The results of the holography were verified by theoretical modeling of diffraction patterns using the EDAC algorithm. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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