Effects of Oxide-trapped Charges and Interface Traps in Organic Self-assembled Monolayer/Silicon Systems due to Local Current Injection.

Autor:	Han, Jiwon, Oh, Sangsoo, Kim, Hosup, Kim, Haejong, Choi, Sungwoong, Yang, Jeonghyeon
Zdroj:	Journal of the Korean Physical Society; Nov2020, Vol. 77 Issue 9, p759-763, 5p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink