Low Energy, High Density Plasma (ICP) for Low Defect Etching and Deposition Applications on Compound Semiconductors.

Autor: Etrillard, J., Maher, H., Medjdoub, M., Courant, J. L., Nissim, Y. I.
Zdroj: MRS Online Proceedings Library; 1999, Vol. 573 Issue 1, p189-201, 13p
Databáze: Complementary Index