The Effect of Roughness Features on Mos Surface Electric Field and Fowler-Nordheim Tunneling Behavior.
| Autor: | Lin, Heng-Chih, Kan, Edwin C., Yamanaka, Toshiaki, Fang, Simon J., Eason, Kwame N., Helms, C. R. |
|---|---|
| Zdroj: | MRS Online Proceedings Library; 1997, Vol. 473 Issue 1, p175-180, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
Full text from SpringerLink