Composition Dependence of Dielectric Anomaly in Strontium Bismuth Tantalate Thin Films.

Autor: Takemura, Koichi, Noguchi, Takehiro, Hase, Takashi, Kimura, Hidekazu, Miyasaka, Yoichi
Zdroj: MRS Online Proceedings Library; 1998, Vol. 541 Issue 1, p235-240, 6p
Databáze: Complementary Index