Autor: |
Vavilova, V. V., Simakov, S. V., Kannykin, S. V., Il'inova, T. N., Chueva, T. R., Anosova, M. O. |
Zdroj: |
Russian Metallurgy (Metally); Sep2020, Vol. 2020 Issue 9, p1013-1019, 7p |
Abstrakt: |
The fraction of the amorphous phase remaining after the crystallization of amorphous alloys with one (P), two (P, Si) and three (P, Si, C) amorphizers is determined by X-ray diffraction. An increase in the fraction of a single-phase matrix is found to inhibit the crystallization during fast photon irradiation and heat treatment. Differential scanning calorimetry demonstrates that an increase in the number of amorphizers leads to a decrease in the crystallization rate of a structure, which is stable in an industrial atmosphere. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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