Easily testable circuits in Zhegalkin basis in the case of constant faults of type "1" at gate outputs.

Autor:	Borodina, Yulia V.
Předmět:	LOGIC circuits BOOLEAN functions TEST design GATES
Zdroj:	Discrete Mathematics & Applications; Oct2020, Vol. 30 Issue 5, p303-306, 4p
Abstrakt:	We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length 1 in case of constant faults of type "1" at gate outputs. [ABSTRACT FROM AUTHOR]
Databáze:	Complementary Index
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