Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy.
| Autor: | Shi, Xinying, Huttula, Marko, Pankratov, Vladimir, Hoszowska, Joanna, Dousse, Jean-Claude, Zeeshan, Faisal, Niu, Yuran, Zakharov, Alexei, Huang, Zhongjia, Wang, Gang, Posysaev, Sergei, Miroshnichenko, Olga, Alatalo, Matti, Cao, Wei |
|---|---|
| Zdroj: | Microscopy & Microanalysis; 2018 Supplement2, Vol. 24, p458-459, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|