| Autor: |
Saxena, Pallavi, Choudhary, P., Yadav, A., Rai, V. N., Mishra, A. |
| Předmět: |
|
| Zdroj: |
Journal of Materials Science: Materials in Electronics; Aug2020, Vol. 31 Issue 15, p12444-12454, 11p |
| Abstrakt: |
Study of multiferroic Y1−xSrxCrO3 (x = 0.0, 0.1) chromite obtained through solid-state reaction technique is presented. The Rietveld refinement of the XRD profile shows the orthorhombic Pbnm crystal symmetry of the system. The bandgaps of YCrO3 and Y0.9Sr0.1CrO3 samples are found as ~ 2.31 and ~ 2.23 eV, respectively. The FTIR spectra peaks show a red shift in the case of Sr2+ ion doping in YCrO3 indicating the reduction in cell volume. Two dielectric relaxation peaks are observed in the YCrO3 , whereas Y0.9Sr0.1CrO3 shows only one broad peak that is found to be extremely frequency dependent. The dielectric peak maxima shifts to higher temperatures with an increase in frequency in both the samples. This kind of dielectric variation is indicating a relaxor type of dielectric material. It is noted that the observed conductive process is closely associated with thermally stimulated oxygen vacancies. The P–E loops of both the samples have completely round shape with maximum polarization (Pmax) being observed at zero electric field. For YCrO3, the mechanism of leakage current conduction is in good agreement with the Ohmic conduction mechanism, whereas Y0.9Sr0.1CrO3 agrees well with space charge-limited conduction mechanism. The decreased bandgap and leakage current makes the Sr2+ ion doping beneficial for various electronic applications. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
Full text from SpringerLink