Processing of X-Ray Diffraction Data in Structure Investigations of Amorphous Metal Oxides.

Autor: Bataronov, I. L., Posmet'yev, V. V., Barmin, Yu. V.
Předmět:
Zdroj: Ferroelectrics; 2004, Vol. 307 Issue 1, p191-197, 7p
Abstrakt: The usual algorithm of the structure factor calculation, which is widely used for amorphous metals and amorphous semiconductors, cannot be applied to a number of amorphous metal oxides. Instead, we have developed a new algorithm based on the middle line method. It uses analytical properties of the structure factor and radial distribution function. The method has been applied to amorphous PbTiO3. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index