| Autor: |
Menou, N., Castagnos, A.-M., Muller, Ch., Johnson, J., Wouters, D. J., Baturin, I., Shur, V. Ya. |
| Předmět: |
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| Zdroj: |
Integrated Ferroelectrics; 2004, Vol. 61 Issue 1, p89-95, 7p |
| Abstrakt: |
This paper presents a preliminary study of the degradation and restoration of ferroelectric properties under X-ray irradiation of Pt/SBT/Pt ferroelectric capacitors (FeCAP) and the degradation in Pt/PZT/Pt FeCAPs. The results seem to point out that aging of irradiated capacitors originates from the pinning of domain walls due to trapping of photo-generated carriers at domain boundaries. For SBT FeCAPs, the recovery of a significant switchable polarisation after electrical cycling under X-ray irradiation indicates that the domain walls are probably weakly pinned. In PZT FeCAPs, the fatigue behaviour during X-ray exposure can be explained as a result of X-ray induced acceleration of the bulk screening process due to increasing of the concentration of bulk carriers, which leads to both static and kinetic imprint effects. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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