| Autor: |
Du Boulay, D., Ishizawa, N., Atake, T., Streltsov, V., Ruruya, K., Munakata, F. |
| Předmět: |
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| Zdroj: |
Acta Crystallographica: Section B (Wiley-Blackwell); Aug2004, Vol. 60 Issue 4, p388-405, 18p, 1 Color Photograph, 27 Diagrams, 10 Charts |
| Abstrakt: |
Almost absorption- and extinction-free single-crystal synchrotron X-ray diffraction data were measured at 150, 200 and 295 K for β-Si3N4, silicon nitride, at a wavelength of 0.7 Å. The true symmetry of this material has been the subject of minor controversy for several decades. No compelling evidence favouring the low-symmetry P63 model was identified in this study. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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