| Autor: |
Guillén-Cervantes, A., Becerril-Silva, M., Silva-López, H. E., Arias-Cerón, J. S., Campos-González, E., Pérez-González, M., Zelaya-Ángel, O. |
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| Zdroj: |
Journal of Materials Science: Materials in Electronics; May2020, Vol. 31 Issue 9, p7133-7140, 8p |
| Abstrakt: |
Cadmium telluride plus cadmium tellurite (CdTe + CdTeO3) nanocomposite films were grown by radio frequency magnetron sputtering at room temperature. The CdTe + CdTeO3 samples were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), Raman spectroscopy, UV–Vis absorption, and room temperature photoluminescence (RTPL). XRD and TEM results indicate that films are composed of CdTe and CdTeO3 nanoparticles (NP's) with 6.7 ± 0.8 nm and 6 ± 1 nm in size, respectively. CdTe NPs grew in hexagonal wurtzite and cubic zinc blende crystalline phases. CdTeO3 NPs are crystalized in cubic phase. Direct bandgap (Eg) (first discrete electronic transition) calculation indicates Eg = 2.6 ± 0.2 eV for CdTe and 3.3 ± 0.2 eV for CdTeO3. RTPL spectrum evidences a wide signal in the 2.0 to 3.25 eV interval. Results reveal that the emission band maximum, which is centered in the blue region of the visible light, is related with band-to-band transitions in CdTe NPs. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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