Autor: |
Fowler, P. E., Tarassov, A., Lee, G-I., Pasupuleti, D., Ray, A., Eiceman, G. A. |
Zdroj: |
International Journal for Ion Mobility Spectrometry; Apr2020, Vol. 23 Issue 1, p9-17, 9p |
Abstrakt: |
In small planar differential mobility spectrometers with ambient pressure ion sources, both ions and neutral vapors of sample commonly flow from the ion source directly into and through the analyzer region. Although simple and convenient both for fabrication and operation, product ions derived from sample in this design may form clusters with neutral unreacted sample or matrix constituents particularly at vapor levels of 50 ppm or greater. Uncontrolled and changing levels of such neutrals cause concentration dependent formation of ion clusters with variations in compensation voltages of DMS spectra. Stable compensation voltages were achieved for product ions by extracting ions into a counter flow of purified gas excluding neutral vapors from ppm to percent levels. An interface with electric fields and purified air was placed between ion source and analyzer region and operated with both on-axis and orthogonal extraction of ions. Effectiveness of removal of neutrals was determined using variations in peak position for protonated monomers and proton bound dimers of dimethylmethylphosphate, significantly avoiding complications of ionization chemistry with high vapor concentrations of methylene chloride, iso-propanol, water, and methanol. In-silico modeling using COMSOL and SIMION clarified the flow of ions and gases in two modes of operation. Findings anticipate the development of multiple stages of DMS analyzers where vapors may be intentionally added as modifiers in one stage and removed before entering a subsequent stage. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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