Characterization of micro-pixelated InGaP/AlGaInP quantum well structures.
| Autor: | Kim, Jong Kyu, Krames, Michael R., Strassburg, Martin, Boussadi, Younes, Rochat, Névine, Barnes, Jean-Paul, Ben Bakir, Badhise, Ferrandis, Philippe, Masenelli, Bruno, Licitra, Christophe |
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| Zdroj: | Proceedings of SPIE; 12/31/2019, Vol. 11302, p1130221-1130221, 1p |
| Databáze: | Complementary Index |
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