| Autor: |
Afanas'ev, V. P., Popov, A. I., Barinov, A. D., Bodisko, Yu. N., Bocharov, G. S., Gryazev, A. S., Eletskii, A. V., Kaplya, P. S., Miroshnikova, I. N., Ridzel', O. Yu. |
| Předmět: |
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| Zdroj: |
Russian Microelectronics; Jan2020, Vol. 49 Issue 1, p47-54, 8p |
| Abstrakt: |
The results of the analysis of carbon-containing materials are presented based on an analysis of the peaks of X-ray photoelectron spectroscopy (XPS) formed by the electrons leaving the analyzed sample in a vacuum without energy loss (peak shape analysis, PSA) and based on the interpretation of the widest possible area of energy loss adjacent to the photoelectron spectroscopy (PES) peak. It is shown that the PES analysis of diamond-like materials containing alloying additives, the concentration of which is comparable with the concentration of carbon, is not effective. The PES analysis of graphene oxide samples that were heat-treated to remove oxygen gave detailed information about the laws of the energy loss of photoelectrons emitted from the 1s level, which determines the allotropic variety of carbon. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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