| Autor: |
Tan, Chao, Femine, Antonio Delle, Gallo, Daniele, Landi, Carmine, Luiso, Mario |
| Předmět: |
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| Zdroj: |
Transactions of the Institute of Measurement & Control; Feb2020, Vol. 42 Issue 4, p749-758, 10p |
| Abstrakt: |
In many engineering applications the phase angle of a signal is a key parameter. Especially when measuring small angles, the measurement accuracy is of a vital importance. Often, the absolute phase error of a digitizer, which is defined as the phase displacement between the digitized output and the input analog waveform and which represents a systematic measurement error, is neglected. Therefore, in this paper, a new measurement technique for the evaluation of this absolute phase error is discussed, along with a deep theoretical analysis on the uncertainty sources and how to handle them. The measurement technique is validated through a high accuracy experimental setup. Experimental tests demonstrate that even high accuracy digitizers can show non-linear behavior in the absolute phase errors. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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