| Autor: |
Mavrakakis, K., Booske, J. H., Behdad, N. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2/21/2020, Vol. 127 Issue 7, p1-8, 8p, 4 Diagrams, 1 Chart, 7 Graphs |
| Abstrakt: |
We present the results of an experimental investigation of polystyrene's suitability as a dielectric material for designing narrowband, infrared metasurface-based absorbers. Our study included characterization of processing parameters of polystyrene films, such as surface roughness and film thickness, which are critical for device fabrication, and the dielectric properties, which we measured, using spectroscopic ellipsometry. Our results confirm that thin film polystyrene is a relatively low-loss dielectric material at long-wave infrared (LWIR) frequencies. Subsequently, this material was used as the dielectric substrate of a thin, narrowband, metasurface-based absorber at LWIR frequencies. The fabricated narrowband absorber demonstrates excellent performance in the LWIR band with absorptivity as high as 96% and a full-width-at-half-maximum bandwidth of 0.502 μ m or 4.87%. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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