| Autor: |
Jakieła, Rafał, Galicka, Marta, Dziawa, Piotr, Springholz, Gunther, Barcz, Adam |
| Předmět: |
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| Zdroj: |
Surface & Interface Analysis: SIA; Mar2020, Vol. 52 Issue 3, p71-75, 5p |
| Abstrakt: |
Substitutional alloy Pb1 − xSnxSe is a new class of electronic materials called topological crystalline insulators, which at the temperature range from 0 K to 300 K exhibit topological state at compositions in the range 0.18 < x < 0.40 (in the rock‐salt structure). In this report, we present a secondary ion mass spectrometry (SIMS) analysis technique to provide accurate Pb and Sn composition based on the measurement of PbCs+ and SnCs+ cluster ions intensities. Studies of Pb1 − xSnxSe bulk samples with various values of x show that x/(1 − x) is linear in relation to the intensity ratio of PbCs+/SnCs+ over the range from x = 0.15 to x = 0.41. This technique allows us to obtain an accurate Sn content for multilayered heterostructures, quantum wells containing Pb1 − xSnxSe with different x values for each layer. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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