| Autor: |
Hales, Joel M., Cressler, John D., McMorrow, Dale, Khachatrian, Ani, Buchner, Stephen, Warner, Jeffrey, Ildefonso, Adrian, Tzintzarov, George N., Nergui, Delgermaa, Monahan, Daniele M., LaLumondiere, Stephen D. |
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| Zdroj: |
IEEE Transactions on Nuclear Science; Feb2020, Vol. 67 Issue 2, p81-90, 10p |
| Abstrakt: |
A novel approach for two-photon absorption (TPA) pulsed-laser testing produces extended charge deposition profiles that are analogous to those produced by heavy ions. In this approach, which utilizes an axicon rather than a spherical lens, the conventional Gaussian beam is replaced by a quasi-Bessel beam. The key feature of a quasi-Bessel beam, relevant to pulsed-laser single-event effects (PL-SEE) studies, is that its radial size (1~μm) remains constant over the axial length of the beam (several 100 s of μm) resulting in a charge-deposition profile that more closely mimics that produced by a heavy ion. This elongated charge distribution directly lends itself to a simple and intuitive description in terms of linear-energy transfer (LET), facilitating laser/ion correlation studies. Experimental results comparing a conventional TPA PL-SEE focusing geometry and the axicon focusing geometry are presented for three different test vehicles: a 45-nm silicon-on-insulator (SOI) nFET, a bulk silicon photodiode, and an LM124 operational amplifier. By using the axicon approach, strong laser/ion correlation is observed in the silicon photodiode for single-event transients (SET) across a wide range of LETs. The correlation is achieved by “tuning” the laser to the desired LET rather than relying on preexisting heavy-ion data, and therefore, this approach holds promise as a predictive tool. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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