Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects.

Autor: Chernyak, M. E., Ranneva, E. V., Ulanova, A. V., Nikiforov, A. Yu., Verizhnikov, A. I., Tsyrlov, A. M., Fedosov, V. S., Shchepanov, A. N., Kalashnikov, V. D., Titovets, D. O.
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Zdroj: Russian Microelectronics; Nov2019, Vol. 48 Issue 6, p415-421, 7p
Abstrakt: This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improved. Upon modification, the radiation hardness of the device more than triples. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index