Noise-induced resistive switching in a memristor based on ZrO2(Y)/Ta2O5 stack.

Autor: D O Filatov, D V Vrzheshch, O V Tabakov, A S Novikov, A I Belov, I N Antonov, V V Sharkov, M N Koryazhkina, A N Mikhaylov, O N Gorshkov, A A Dubkov, A Carollo, B Spagnolo
Zdroj: Journal of Statistical Mechanics: Theory & Experiment; Dec2019, Vol. 2019 Issue 12, p1-1, 1p
Databáze: Complementary Index