Radiation induced degradation of optoelectronic sensors.

Autor: Inguimberta, C., Nuns, T., Hervé, D., Vriet, A., Barbero, J., Moreno, J., Nedelcu, A., Ducret, S., Saint-Pé, O., Larnaudie, F., Gilard, O., Aicardi, C.
Zdroj: Proceedings of SPIE; 8/10/2019, Vol. 11159, p1-14, 14p
Databáze: Complementary Index