Radiation induced degradation of optoelectronic sensors.
Autor: | Inguimberta, C., Nuns, T., Hervé, D., Vriet, A., Barbero, J., Moreno, J., Nedelcu, A., Ducret, S., Saint-Pé, O., Larnaudie, F., Gilard, O., Aicardi, C. |
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Zdroj: | Proceedings of SPIE; 8/10/2019, Vol. 11159, p1-14, 14p |
Databáze: | Complementary Index |
Externí odkaz: |