Analysis of the Influence of Technological Parameters on Electrophysical and Frequency Characteristics of RF MEMS.

Autor: Belevtsev, Andrey M., Epaneshnikova, Irina K., Kruchkov, Vasiliy L., Dryagin, Ivan O., Lukichev, Vladimir F., Boldyreff, Anton S.
Zdroj: Proceedings of SPIE; 8/14/2019, Vol. 11163, p111630L-1-111630L-9, 9p
Databáze: Complementary Index