| Autor: |
Xue, C., Papadimitriou, D., Raptis, Y. S., Richter, W., Esser, N., Siebentritt, S., Lux-Steiner, M. Ch. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 8/15/2004, Vol. 96 Issue 4, p1963-1966, 4p, 1 Black and White Photograph, 1 Diagram, 3 Graphs |
| Abstrakt: |
The structural properties of copper selenide (CuxSe), formed as a secondary phase on the surface of CuGaSe2 films grown under Cu-rich conditions on GaAs (100) substrates, were studied by micro-Raman spectroscopy. Raman bands at 45 and 263 cm-1, observed on crystallites dispersed on the CuGaSe2 film, are in agreement with the Raman modes of CuSe and Cu2Se. Polarization- and angular-dependent micro-Raman measurements reveal that the CuxSe-crystallites are grown with a preferential orientation on the CuGaSe2 surface. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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