| Autor: |
Jaouen, Nicolas, Tonnere, Jean-Marc, Kapoujian, Grigor, Taunier, Pierre, Roux, Jean-Paul, Raoux, Denis, Sirotti, Fausto |
| Předmět: |
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| Zdroj: |
Journal of Synchrotron Radiation; Jul2004, Vol. 11 Issue 4, p353-357, 5p, 2 Diagrams, 6 Graphs |
| Abstrakt: |
Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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