Automatic condition monitoring method to find defects in high-voltage insulators using infrared images.
| Autor: | Shamsutdinov, E.V., Vankov, Yu.V., Sergeev, V.V., Zaripova, A. D., Zaripov, D. K., Usachev, A. E. |
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| Zdroj: | E3S Web of Conferences; 2019, Vol. 124, p1-5, 5p |
| Databáze: | Complementary Index |
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