| Autor: |
Prajapati, Suman, Singh, Bhupendra, Singh, B. K., Llovet, X., Shanker, R. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2019, Vol. 2142 Issue 1, p140006-1-140006-4, 4p |
| Abstrakt: |
The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα, and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied.The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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