| Autor: |
Chen, Bichen, He, Jiayi, Guo, Yuandong, Pan, Siming, Ye, Xiaoning, Fan, Jun |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Electromagnetic Compatibility; Aug2019, Vol. 61 Issue 4, p1261-1270, 10p |
| Abstrakt: |
Because of the simplicity of design and measurement, as well as the accuracy of results, the 2×-thru de-embedding has replaced the traditional de-embedding algorithms such as thru-reflect-line and short-open-load-thru for printed circuit board (PCB) characterization. In this paper, the theory of [$2^{n}$ -port 2×-Thru de-embedding is derived first. The self-error reduction schemes are introduced to mitigate the de-embedding errors due to non-ideal manufacturing effects that make mode conversion terms non-zero. Both the theory and the self-error reduction schemes are fully validated through simulation and measurement cases. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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