| Autor: |
Siu, Kai Wing, Ngan, Alfonso Hing Wan |
| Předmět: |
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| Zdroj: |
Physica Status Solidi (B); Aug2019, Vol. 256 Issue 8, pN.PAG-N.PAG, 1p |
| Abstrakt: |
It is often assumed that the Peierls stress of single dislocations can reflect accurately the macroscopic yield stress. Here, dislocation dynamics simulations show that the yield stress‐to‐Peierls stress (Y/P) ratio remains within a small range of ≈0.3 ± 0.1, over a wide range of initial dislocation density, mobile dislocation fraction, and temperature which affects cross slip. This range of Y/P arises from the typical stress concentration ahead of dislocation pile‐ups. The results explain why Y/P was observed to be around one‐third in previous experiments. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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