| Autor: |
Thomas, Tijin, Mathew, Alex, R., Reshmi |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 5/24/2019, Vol. 2115 Issue 1, p030116-1-030116-4, 4p, 1 Black and White Photograph, 1 Diagram, 1 Chart, 1 Graph |
| Abstrakt: |
In the present study we report the changes in the microstructural, optical and electrical properties of the α- MoO3 nano rods deposited on glass substrate using vacuum thermal evaporation and annealed for different temperatures post deposition. The structural studies using X-ray diffraction shows that α-MoO3 films are amorphous up to 250°C and starts to crystallize with a preferred orientation (0 k 0){k=2,4,6) from 300°C. The morphological characterization reveals the formation of aligned nano rods with onset of crystallization. The absorption studies shows a blue shift in the absorption edge for crystalline samples. The temperature dependent conductivity in planar mode shows semiconducting nature for crystalline samples but with lower conductivity. The room temperature conductivity shows no notable changes with respect to annealing temperature. The significant changes in the properties of α-MoO3 nano rods are observed with the increase in the annealing temperature which underlines the importance of post deposition annealing and its optimization for various application in the fabrication of transparent optoelectronic device configurations more economically. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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