Artificial intelligence/machine learning in manufacturing and inspection: A GE perspective.

Autor: Reyes, Kristofer G., Maruyama, Benji, Aggour, Kareem S., Gupta, Vipul K., Ruscitto, Daniel, Ajdelsztajn, Leonardo, Bian, Xiao, Brosnan, Kristen H., Chennimalai Kumar, Natarajan, Dheeradhada, Voramon, Hanlon, Timothy, Iyer, Naresh, Karandikar, Jaydeep, Li, Peng, Moitra, Abha, Reimann, Johan, Robinson, Dean M., Santamaria-Pang, Alberto, Shen, Chen, Soare, Monica A.
Zdroj: MRS Bulletin; Jul2019, Vol. 44 Issue 7, p545-558, 14p
Databáze: Complementary Index
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