A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction.
| Autor: | Johnson, Ian J., Bustillo, Karen C., Ciston, Jim, Draney, Brent R., Ercius, Peter, Fong, Erin, Goldschmidt, Azriel, Joseph, John M., Lee, Jason R., Minor, Andrew M., Ophus, Colin, Selvarajan, Ashwin, Skinner, David E., Stezelberger, Thorsten, Tindall, Craig S., Denes, Peter |
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| Zdroj: | Microscopy & Microanalysis; 2018Supplement1, Vol. 24, p166-167, 2p |
| Databáze: | Complementary Index |
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