A PROPOSED NEW METHOD OF MEASURING MICROWAVE POWER AND IMPEDANCE USING HALL EFFECT IN A SEMICONDUCTOR.
| Autor: | BARLOW, H. E. M. |
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| Zdroj: | Proceedings of the IEE - Part B: Electronic & Communication Engineering; 1962, Vol. 109 Issue 45, p286-289, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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