Characterization and setting protocol for a simultaneous X-ray Diffraction - X-ray Fluorescence system (XRD/XRF) for in situ analysis.

Autor:	Aguilar, Valentina, Ruvalcaba-Sil, José Luis, Bucio, Lauro, Rivera-Muñoz, Eric M.
Zdroj:	European Physical Journal Plus; Jun2019, Vol. 134 Issue 6, pN.PAG-N.PAG, 1p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink