Engineered nanostructures’ characterization by spectral interferometric microscopy.
| Autor: | Symeonidis, Michail, Suryadharma, Radius N. S., Grillo, Rossella, Scharf, Toralf, Rockstuhl, Carsten, Bürgi, Thomas |
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| Zdroj: | Proceedings of SPIE; 12/21/2018, Vol. 10927, p1092712-1-1092712-9, 9p |
| Databáze: | Complementary Index |
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