Localized Power Spectral Density analysis on Atomic Force Microscopy images for Advanced Patterning applications.
| Autor: | Moussa, Alain, Saib, Mohamed, Paolillo, Sara, Lazzarino, Frederic, Illiberi, Andrea, Dengb, Shaoren, Maes, Jan Willem, Charley, Anne-Laure, Leray, Philippe |
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| Zdroj: | Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-8, 8p |
| Databáze: | Complementary Index |
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