Color mixing in overlay metrology for greater accuracy and robus.

Autor: Mathijssen, Simon, Noot, Marc, Bozkurt, Murat, Javaheri, Narjes, Hajiahmadi, Reza, Zagaris, Antonios, Ken Chang, Gosali, Benny, Su, Eason, Wang, Cathy, den Boef, Arie, Bhattacharyya, Kaustuve, Guo-Tsai Huang, Kai-Hsiung Chen, Lin, John
Zdroj: Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-8, 8p
Databáze: Complementary Index