| Autor: |
Sprengard, Ruediger, Sjogren, Brian, Nass, Peter, Ottermann, Clemens, Lange, Berthold, Damm, Thorsten, Plapper, Volker, Dietrich, Volker, Maurer, Ulrich, Fang, Helen, Weng, Nicolas, Wang, Alex, Apitz, Dirk, Brauneck, Ulf, Wyrowski, F., Hellmann, C., Crailsheim, H. |
| Předmět: |
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| Zdroj: |
SID Symposium Digest of Technical Papers; Jun2019, Vol. 50 Issue 1, p116-120, 5p |
| Abstrakt: |
Waveguide Technology is widely believed to constitute one of the most promising approaches to realize affordable Augmented Reality (AR) / Mixed Reality (MR) devices combining smallest form‐factor with uncompromised image quality allowing for full immersion user experience. Optical waveguides are made from special grade glass wafers. The characteristics of such wafers are directly determining image properties, such as Field‐of‐View, contrast, brightness, distortion of the image projected into the user's eye and many more. We are reporting latest advances in measuring and controlling key quality parameters with focus on total thickness variation, optical homogeneity and thickness tolerance of the wafers. We discuss the impact of these parameters on image quality using optical modelling of the waveguides. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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