Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.

Autor:	Madge, Robert, Benware, Brady R., Daasch, W. Robert
Předmět:	SEMICONDUCTORS testing INTEGRATED circuit design INTEGRATED circuit layout ELECTRONIC circuit design MICROELECTRONICS COMPUTER engineering
Zdroj:	IEEE Design & Test of Computers; Sep/Oct2003, Vol. 20 Issue 5, p46-53, 8p, 4 Black and White Photographs, 3 Diagrams, 1 Chart, 5 Graphs
Abstrakt:	Studies the effectiveness of structured delay tests in identifying defective silicon in integrated circuit design and fabrication. Defect screening; Structural tests for screening frequency-dependent defects; Pattern description; Results of tests; Minimum V[sub DD] testing for outlier screening; Feed-forward testing for cost-effective outlier screening; Statistical post-processing applied to minimum V[sub DD] and F[sub max] data sets.
Databáze:	Complementary Index
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