| Autor: |
Matsuda, T., Takada, K., Yano, K., Shimomura, S., Ishikawa, F. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/21/2019, Vol. 125 Issue 19, pN.PAG-N.PAG, 5p, 2 Black and White Photographs, 1 Diagram, 1 Chart, 2 Graphs |
| Abstrakt: |
We present the growth and strain deformation of sharp-facetted GaAs/GaAsBi core–shell heterostructure nanowires on a Si (111) substrate. The nanowires have a 90 nm wide GaAs core surrounded by an 80 nm thick GaAsBi shell. The sample was analyzed using microbeam synchrotron x-ray diffraction to resolve the local strain status at the GaAs/GaAsBi heterointerface. GaAsBi showed identical lattice constants for its vertical and lateral lattice planes. From the lattice constants, the Bi concentration in GaAsBi was estimated to be approximately 1.3%. In contrast, the GaAs core showed biaxial strain deformation, exhibiting an enlarged vertical lattice constant identical to that of the GaAsBi shell. These layers are coherently grown at the sidewalls of the nanowires, preserving identical vertical lattice constants between the constituent layers in the heterostructure. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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