XPS studies of charging effect induced by X-ray irradiation on amorphous SiO2 thin films.
| Autor: | Dai Peng Xing, Hui Zhong Zeng, Wen Xu Zhang, Wan Li Zhang |
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| Zdroj: | IOP Conference Series: Materials Science & Engineering; Apr2019, Vol. 490 Issue 2, p1-1, 1p |
| Databáze: | Complementary Index |
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