OPC strategies to reduce failure rates with rigorous resist model stochastic simulations in EUVL.

Autor: Pret, Alessandro Vaglio, Graves, Trey, Blankenship, David, Robertson, Stewart A., Lee, Patrick, Biafore, John J.
Zdroj: Proceedings of SPIE; 1/20/2019, Vol. 10957, p109570J-1-09570J-9, 9p
Databáze: Complementary Index