| Autor: |
Wei, D. H., Hsu, Y. J., Yin, G. C., Wu, Y. S., Chuang, S. C., Tsang, K. L., Ou, J. Y., Wu, J. C., Warwick, T. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2004, Vol. 705 Issue 1, p905-908, 4p |
| Abstrakt: |
We have established a soft x-ray photoemission electron microscopy station at BL05B elliptically polarized undulator beamline, which provides an average photon flux of 1× 1012 photons/sec in energies from 60 to 1400 eV with an resolving power of greater than 100000. Combination of the variable polarization and high brightness photon source makes the microscopy station powerful enough to spatially resolve the absorption anisotropy in micrometer sized area. We present some of the commission results to show the element-specific magnetic domain images and contrast enhancement by the polarized photon source. © 2004 American Institute of Physics [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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