Edge-emitting Si Avalanche Mode LED integrated into a SiGe RF bipolar technology: Optical power emission characterization with optical probe mapping technique.
| Autor: | Ogudo, Kingsley A., Polleux, Jean-Luc, Snyman, Lukas W. |
|---|---|
| Zdroj: | Proceedings of SPIE; 4/16/2019, Vol. 11043, p1-16, 16p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|