X-Ray Properties of SPT-selected Galaxy Clusters at 0.2 < z < 1.5 Observed with XMM-Newton.

Autor: Esra Bulbul, I-Non Chiu, Joseph J. Mohr, Michael McDonald, Bradford Benson, Mark W. Bautz, Matthew Bayliss, Lindsey Bleem, Mark Brodwin, Sebastian Bocquet, Raffaella Capasso, Jörg P. Dietrich, Bill Forman, Julie Hlavacek-Larrondo, W. L. Holzapfel, Gourav Khullar, Matthias Klein, Ralph Kraft, Eric D. Miller, Christian Reichardt
Předmět:
Zdroj: Astrophysical Journal; 1/20/2019, Vol. 871 Issue 1, p1-1, 1p
Abstrakt: We present measurements of the X-ray observables of the intracluster medium (ICM), including luminosity LX, ICM mass MICM, emission-weighted mean temperature TX, and integrated pressure YX, that are derived from XMM-Newton X-ray observations of a Sunyaev–Zel’dovich effect (SZE) selected sample of 59 galaxy clusters from the South Pole Telescope SPT-SZ survey that span the redshift range 0.20 < z < 1.5. We constrain the best-fit power-law scaling relations between X-ray observables, redshift, and halo mass. The halo masses are estimated based on previously published SZE observable-to-mass scaling relations, calibrated using information that includes the halo mass function. Employing SZE-based masses in this sample enables us to constrain these scaling relations for massive galaxy clusters (M500 ≥ 3 × 1014M) to the highest redshifts where these clusters exist without concern for X-ray selection biases. We find that the mass trends are steeper than self-similarity in all cases, and with ≥2.5σ significance in the case of LX and MICM. The redshift trends are consistent with the self-similar expectation, but the uncertainties remain large. Core-included scaling relations tend to have steeper mass trends for LX. There is no convincing evidence for a redshift-dependent mass trend in any observable. The constraints on the amplitudes of the fitted scaling relations are currently limited by the systematic uncertainties on the SZE-based halo masses, but the redshift and mass trends are limited by the X-ray sample size and the measurement uncertainties of the X-ray observables. [ABSTRACT FROM AUTHOR]
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