| Autor: |
Veliyulin, E. |
| Předmět: |
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| Zdroj: |
Scientific Israel: Technological Advantages; 2018, Vol. 20 Issue 4, p54-56, 3p |
| Abstrakt: |
By the local electroreflectance method the topographic analysis of Ge1-x Six monocrystal surface was performed. The influence of the surface orientation on defects density distribution was found. Topographic maps of the defectiveness distribution on the crystal surfaces with (111) and (110) orientations were constructed and visualized. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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